发明名称 ADJUSTING DEVICE AND TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an adjusting device, in which the delay time for the rise time of an input signal and the delay time for the fall time of the input signal are adjusted. SOLUTION: The adjusting device 152 is provided with a first delay circuit 166, in which the rise time of the input signal is delayed more than the fall time of the input signal, a second delay circuit 168 in which the fall time of the input signal is delayed more than the rise time of the input signal and a selection part 176 which selects the first delay circuit or the second delay circuit and in which the input signal adjusted by the selected delay circuit is output as an adjusting signal.
申请公布号 JP2002100966(A) 申请公布日期 2002.04.05
申请号 JP20000288415 申请日期 2000.09.22
申请人 ADVANTEST CORP 发明人 NIIJIMA HIROKATSU
分类号 G01R31/319;G01R31/28;G11C11/4076;H03K5/131;H03K5/14 主分类号 G01R31/319
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