发明名称 SYSTEM AND METHOD FOR REMOTELY DIAGNOSING SEMICONDUCTOR PRODUCTION FACILITY
摘要 <p>PROBLEM TO BE SOLVED: To provide a system and a method for remote diagnosis by which both requests of the protection of the secrecy of information in the remote diagnosis of facilities and the prevention of the increase of economical loss are harmonized. SOLUTION: In the remote diagnosis system for semiconductor production facilities for diagnosing a semiconductor production facilities 10, a user connects the semiconductor production facilities 10 to a diagnosing unit 70 provided by a specified third person through communication networks (30, 40, 50 and 60). The diagnosing unit 70 is provided with at least one diagnosis program (90, 100 or 110) for performing diagnosing processing of the semiconductor production facilities and a control part for starting the diagnosis program corresponding to access from a terminal 20 of the specified user to whom an access right is imparted. The right to utilize the diagnosing unit for pay is imparted to the user, who transmits data requested from the diagnosing unit to the diagnosing unit in the case of diagnosis and receives the diagnosed result from the diagnosing unit.</p>
申请公布号 JP2002099323(A) 申请公布日期 2002.04.05
申请号 JP20000289304 申请日期 2000.09.22
申请人 HITACHI LTD 发明人 TSUMAKI NOBUO;TAKAHASHI NUSHITO;YAMAMOTO HIDEYUKI
分类号 G06F13/00;G05B23/02;H01L21/02;(IPC1-7):G05B23/02 主分类号 G06F13/00
代理机构 代理人
主权项
地址