| 摘要 |
<p>PROBLEM TO BE SOLVED: To shorten an inspection time of a leak current per semiconductor element and per semiconductor device in order to improve processing ability of a selection device of the semiconductor device. SOLUTION: In this selection method of the semiconductor device, when selecting a quality product of the semiconductor device by leak current measurement of the semiconductor device having plural semiconductor elements included in one package, the sum total of the leak current of all the semiconductor elements included in the semiconductor device is measured by one-time measurement, and in the case where the measurement value is equal to or below a specification, the semiconductor device is judged as a quality product, and in the case where the measurement value is larger than the specification, the semiconductor device is judged as a defective product.</p> |
