发明名称 IC TEST SYSTEM, ITS CONTROL METHOD AND STORAGE MEDIUM
摘要 PROBLEM TO BE SOLVED: To correlate the measurement result of an IC by an IC tester with the classification result by an auto-handler. SOLUTION: The IC tester 1 adds the measurement number characteristic to each lot to the measurement result to be transmitted to the auto-handler 2 and transmits the result, and produces a measurement result file storing measurement data of each IC. The auto-handler 2 produces a classification result file storing classified data of each classified and stored IC based on the measurement number transmitted from the IC tester 1 and category information. The IC tester 1 transfers the produced measurement result file and classification result file to a host computer 3 in each lot, and the host computer 3 memories and controls transferred both files.
申请公布号 JP2002098737(A) 申请公布日期 2002.04.05
申请号 JP20000292442 申请日期 2000.09.26
申请人 ANDO ELECTRIC CO LTD 发明人 MITSUYA TETSUSHI
分类号 G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/26
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