发明名称 POWER SUPPLY UNIT FOR DEVICE OF SEMICONDUCTOR TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent an overcurrent from flowing into a device to be measured at the current application voltage measurement time. SOLUTION: At the current application voltage measurement time, a resistance value of a current detection resistance is increased more than at the voltage application current measurement time, and the gain of a current detection amplifier is decreased in reverse proportion to the increase of the resistance value of the current detection resistance by a gain adjustment circuit. The current detection resistance having the increased resistance value compared with that at the voltage application current measurement time is connected to the middle between a main amplifier and the device to be measured, and the overcurrent is prevented from flowing into the device to be measured at the moment of connection of the device to be measured at the current application voltage measurement time.
申请公布号 JP2002098734(A) 申请公布日期 2002.04.05
申请号 JP20000289454 申请日期 2000.09.22
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 KOTAKE HIDEO
分类号 G01R31/26;G01R31/28;(IPC1-7):G01R31/26 主分类号 G01R31/26
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