发明名称 THIN FILM FORMING SYSTEM
摘要 PROBLEM TO BE SOLVED: To obtain a thin film forming system for thin film transistor(TFT) in which a good semiconductor thin film can be formed by performing formation of a thin film on a substrate, crystallization through irradiation of high energy light and surface treatment of a crystal thin film continuously thereby eliminating the effect of impurities on the surface. SOLUTION: The thin film forming system comprises a linear plasma CVD system for depositing amorphous Si, a linear laser beam irradiating section for crystallizing the amorphous Si, and a linear plasma generator which can lightly oxidize the surface of a crystallized Si thin film with oxygen plasma. They are connected in series and substrates are processed in-line. The entire process progresses in the vacuum or in a controlled atmosphere and the plasma CVD the plasma processing system comprise a high density plasma generating section and a remote plasma where the film depositing section or the surface treating section is separated. Surface of a semiconductor is processed cleanly with low damage a good thin film transistor can be fabricated.
申请公布号 JP2002100578(A) 申请公布日期 2002.04.05
申请号 JP20000333866 申请日期 2000.09.25
申请人 CRYSTAGE CO LTD;PRIME VIEW INTERNATL CO LTD 发明人 MURATA YASUAKI;ITO MASATAKA
分类号 C23C16/44;C23C16/505;H01L21/20;H01L21/205;H01L21/336;H01L29/786;(IPC1-7):H01L21/205 主分类号 C23C16/44
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