| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing device capable of confirming efficiently the characteristic of a symmetrical FIR digital filter. SOLUTION: This device is equipped with a check signal generation circuit 1 for generating a check signal to be inputted into the symmetrical FIR digital filter 2, and a comparison circuit for comparing an output signal of the digital filter 2 with the check signal delayed by a delay circuit 3. The check signal generation circuit 1 generates the check signal for equalizing an input signal waveform of the digital filter 2 with an output signal waveform thereof.
|
