| 摘要 |
A method, system, and apparatus for automated electromagnetic compatibility-driven (EMC-driven) layout and floor planning of electronic devices and systems accounts for electromagnetic interactions between circuit components and addresses internal EMC issues at the outset of the design phase. Problems that may affect system performance are predicted, and a new layout optimized for reduced electromagnetic interference may be suggested, before an expensive prototyping operation is performed. Causes of such problems are also identified with better certainty than is possible from a defective prototype, resulting in a reduced design cycle.
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