发明名称 SEMICONDUCTOR DEVICE HAVING SOI STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: Provided are an SOI semiconductor device and a method for manufacturing the same where a prescribed external connection electrode which is formed on a surface side of a chip is connected with a retaining substrate through a low resistance path and manufacturing is easy. CONSTITUTION: In this SOI semiconductor device, an SiO2 film(3), whose film thickness is about 1μm and a second Si substrate(2), are formed in this order on one main surface of a first Si substrate(1). A plurality of element-forming regions(50), which are isolated dielectrically with isolating trenches(9) in the second Si substrate(2), a region(10) for substrate contact which is arranged on a proper vacant region on a chip(110), and a plurality of electrodes(200G) for external connection are arranged. In the region(10) for substrate contact, a substrate contact hole(13) which penetrates a TEOS oxide film(11) and the SiO2 film(3) which are insulating material and reaches the first Si substrate(1), is formed. The substrate contact hole(13) is filled with a metal(15c) and is connected with a prescribed electrode(200G) for external connection using an Al wiring(16G).
申请公布号 KR20020025778(A) 申请公布日期 2002.04.04
申请号 KR20010060093 申请日期 2001.09.27
申请人 NEC CORPORATION 发明人 KOBAYASHI KENYA
分类号 H01L21/762;H01L21/00;H01L21/3205;H01L21/336;H01L21/44;H01L21/70;H01L21/768;H01L21/84;H01L23/52;H01L25/065;H01L27/01;H01L27/12;H01L29/76;H01L29/786;H01L31/0392;(IPC1-7):H01L27/12 主分类号 H01L21/762
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