| 摘要 |
The invention relates to a device (10) for testing a series of contacts (Cij), which are provided with connection conductors (G, H) for supplying electric current to the contacts (Cij). The known device is less suitable for testing large numbers of contacts (Cij), at least because it is expensive and the testing operation is tedious. A device (10) according to the invention comprises a (semiconductor) body (1) on which the contacts (Cij) are present in the form of an array (A), connection conductors (G, H) which are provided with selection means (S) enabling maximally two contacts (C11, C11') to be selected, said connection conductors (G, H) being formed within maximally two separate metal layers (2, 3). Such a device (10) is inexpensive and easy to manufacture, and it also enables a large number of contacts (Cij) to be (semi-)quantitatively tested at a high speed. In one embodiment, the selection means (S) are formed by diodes (D) in a matrix of a limited number of connection conductors (G, H), enabling only one pair of contacts (C11, C11') to be tested. In another embodiment, the selection means (S) are formed by series-connected capacitors Zij and inductors Lij, enabling each contact (C11) to be individually tested within a network N. |
