发明名称 |
Method and device for detecting and locating irregularities in a dielectric |
摘要 |
The invention relates to a method for detecting at least one irregularity in the dielectric around a substantially elongate conductor, comprising of: applying a potential difference between the conductor and the earth; measuring at a first position voltage changes caused by said irregularity and moving in the direction of the first position; measuring at a second position voltage changes caused by said irregularity and moving in the direction of the second position; determining with the use of time registration the difference in arrival time of voltage changes caused by the same irregularity and measured at the first and second position; determining the position of the irregularity in said conductor on the basis of the, difference in arrival time and the length of said conductor between the first and second position.
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申请公布号 |
US6366095(B1) |
申请公布日期 |
2002.04.02 |
申请号 |
US19990380029 |
申请日期 |
1999.12.07 |
申请人 |
N.V. KEMA |
发明人 |
VAN AARTRIJK DIRK MARINUS |
分类号 |
G01R31/12;G01R31/00;G01R31/08;G01S5/14;(IPC1-7):G01R31/08;G01R31/28;G01R27/28 |
主分类号 |
G01R31/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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