发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent corrosion on a cathode electrode or a seed film in before and after plating. SOLUTION: This method for manufacturing a semiconductor device, in which fixes a wafer with face-down to a cup-like plating tank is fixed, and a voltage between a cathode electrode which contacts with and conducts electric current to a wafer and an anode electrode in the plating tank to plate the wafer is applied while a plating liquid flows in the plating tank along the wafer surface, is characterized in applying a lower waiting voltage than that at a plating time between the cathode electrode and the anode electrode while the wafer or the cathode electrode contacts with the plating liquid to wait. By applying this waiting voltage, the corrosion on the cathode electrode or the seed film can be prevented. Thereby, uniformity of a plated film does not decrease and yields are improved.
申请公布号 JP2002097595(A) 申请公布日期 2002.04.02
申请号 JP20000290027 申请日期 2000.09.25
申请人 HITACHI LTD 发明人 TAKADA YUJI;OKUYA KEN;KAWAKAMI KAZUYA;KAJITA SUSUMU;HASHIMOTO TAKESHI
分类号 C25D7/12;C25D5/08;C25D5/18;C25D21/12;(IPC1-7):C25D7/12 主分类号 C25D7/12
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