发明名称 Apparatus for manufacturing a semiconductor device and a method for manufacturing a semiconductor device
摘要 The purpose of the present invention is to avoid a decrease in the mechanical strength of a Si substrate because of the repetition of ion-implantation and annealing processes. As ions are implanted while the Si substrate surface temperature is kept at as low as -60° C. or less. Then the Si substrate is heated to recover the implantation defects caused by the ion-implantation. Such a combination of the low temperature ion-implantation and the annealing processes is repeated as required.
申请公布号 US6365492(B1) 申请公布日期 2002.04.02
申请号 US20000722477 申请日期 2000.11.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SUGURO KYOICHI;OKUMURA KATSUYA
分类号 H01J37/317;H01L21/265;H01L21/324;(IPC1-7):H01L21/265 主分类号 H01J37/317
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