发明名称 Treatment on silicon oxynitride
摘要 A method to treat a silicon oxynitride surface, including a silicon oxynitride surface covered by a photo resist layer, is described in which the photo resist layer is first removed by an oxygen plasma treatment process, followed by an argon plasma treatment process to overetch the SiON layer.
申请公布号 US6365062(B1) 申请公布日期 2002.04.02
申请号 US19990307219 申请日期 1999.05.07
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHEN I. T.;LU HORNG-BOR
分类号 H01L21/311;(IPC1-7):B44C1/22;H01L21/302 主分类号 H01L21/311
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