| 摘要 |
A built-in test system for analog or mixed signal circuits comprises a discretizer for discretizing analog test signals monitored at various node points of the circuit under test into suitable discrete values. The discrete values are compared with a reference signature in an analog signature generator to determine if a fault is likely. Since analog signature generators use multilevel data, the computations are performed in Galois field GF(p), where p is the radix. The analog signature generator is constructed using current-mode shift registers, signal discretizers, signal level shifters, mod-p adders, subtractors and multipliers.
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