3D profile analysis for surface contour inspection

摘要

A system for inspecting a component is provided. The system includes an imaging system, such as a digital camera. A controller is connected to the digital camera. The controller receives the digital image data of a device that is generated by the camera. The controller processes the digital image data to generate control commands. A variable grid generation system is also connected to the controller. The variable grid generation system can receive commands from the controller, and can generate a grid in response to the commands that matches the component and that allows the component to be inspected.