发明名称 Testing components in digital imaging devices
摘要 A digital imaging system includes an array of sensors arranged generally in rows and columns and having data lines coupled to the sensors. Receiving logic is coupled to sense voltages on the data lines. A reference voltage generator (which can include a resistor network) generates a plurality of reference voltages in the digital imaging system in response to an applied differential voltage. A test row of sensors are electrically coupled to corresponding reference voltages, each test sensor coupled to a data line and receiving a voltage based on its coupled reference voltage. The receiving logic includes at least one A/D converter that reads the test sensor voltage value and converts it to a digital value.
申请公布号 US6366312(B1) 申请公布日期 2002.04.02
申请号 US19980094241 申请日期 1998.06.09
申请人 INTEL CORPORATION 发明人 CRITTENDEN BRENT S.
分类号 H04N17/00;(IPC1-7):H04N17/00 主分类号 H04N17/00
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