ELECTRICAL TEST SYSTEM OF SEMICONDUCTOR DEVICE MOUNTING ONE HANDLER ON TWO STATION TESTERS AND TESTING METHOD THEREOF

摘要

PURPOSE: An electrical test system of a semiconductor device mounting one handler on two station testers is provided to reduce an area occupied by a place for an electrical test of a semiconductor package and to decrease the number of handlers and device under testing(DUT) boards, by mounting one handler on a tester. CONSTITUTION: The tester has two test signal transmission lines capable of being sent to a station. A test signal multiplexer can transmit the two test signal transmission lines to a path. One test head is connected to one test signal transmission line from the test signal multiplexer. A multi handler is connected to the test head. An interface signal transmission line is connected between the tester and the multi handler.