| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem of a conventional semiconductor integrated circuit device in which its area resulting in increasing the manufacturing cost is increased, because the conventional semiconductor integrated circuit device requires a plurality of fuse element groups, fuse state detection circuit groups and ECC(error checking and correcting) error correction circuits. SOLUTION: A redundancy circuit of the semiconductor integrated circuit device is configured, such that a parallel/serial conversion circuit converts blown-out information of a program element group, such as a fuse element group into serial data and a serial parallel conversion circuit transmits the serial data, so as to control circuits to be controlled, such as RAMs, and introducing the CRC technology to the parallel serial conversion circuit can restore information of even wrong entry to a program element, such as a blown-out error of a fuse element. |
