发明名称 TEST COVERAGE MARK SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a test coverage mark system capable of improving the efficiency in test coverage processing by utilizing a marked test code for the next compile as it is. SOLUTION: Passing information is acquired from a source program 10 by an objective processor 2, stored in a shared memory 3, read by a passing information read processor 5, and is transferred to client terminal equipment 6, all source codes, of which the file names are detected, are stored in an external memory 7 by the client terminal equipment 6, and a semi-colon on a source code line corresponding to the passing information detected for each line is retrieved. Then, data on the number of times of passing are marked after the semi-colon, the carrying out of a test, debugging and test coverage measuring are consistently performed without processing the source program, the marked source code is utilized for the next compile as it is, test coverage measurement is efficiently performed, and thus accurate grasping is enabled while accumulating the history of a measuring state.
申请公布号 JP2002091797(A) 申请公布日期 2002.03.29
申请号 JP20000285644 申请日期 2000.09.20
申请人 RICOH CO LTD 发明人 OISHI TSUTOMU
分类号 G06F11/28;G06F11/36;(IPC1-7):G06F11/28 主分类号 G06F11/28
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