发明名称 |
CERAMIC HEATER FOR PRODUCING/INSPECTING SYSTEM OF SEMICONDUCTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a ceramic heater for producing/inspecting system of semiconductor having an excellent uniformity of temperature by using a ceramic material having a high thermal conductivity in the heater substrate. SOLUTION: A disc-like ceramic heater 100 is arranged such that a heater pattern 2 formed on the surface of a ceramic substrate 1 or in the ceramic substrate 1 while describing an R has a substantially constant width. A ceramic nitride (e.g. aluminum nitride) is employed as the material of the ceramic substrate 1 and conductive ceramic particles (carbide of tungsten or molybdenum) is employed as the material of the heater pattern 2. The ceramic substrate 1 is shaped to have a diameter of 200 mm or above and the heater pattern 2 is shaped substantially into an arc having a radius of curvature from 0.1 to 20 mm.
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申请公布号 |
JP2002093677(A) |
申请公布日期 |
2002.03.29 |
申请号 |
JP20010167937 |
申请日期 |
2001.06.04 |
申请人 |
IBIDEN CO LTD |
发明人 |
ITO YASUTAKA |
分类号 |
H05B3/10;H01L21/02;H01L21/027;H01L21/66;H05B3/18;(IPC1-7):H01L21/02 |
主分类号 |
H05B3/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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