发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problem that by the positional variation of the vertex portion of a protruding electrode formed on the electrode of a semiconductor element, the vertex portion of the protruding electrode is bonded pressingly due to the positional discrepancy to the wiring formed on a board, thus make hard the securing of their stable electric connection with each other. SOLUTION: By setting the diameter of a hole 9 of a capillary 8 to a value which is not larger than the width of a wiring 7, the positional variation of a vertex portion 15 of a protruding electrode 6 caused by the capillary 8 is limited within the range of the width of the wiring 7 formed on a board 3, when mounting a semiconductor element 1 on the board 3. Thereby, the vertex portion 15 of the protruding electrode 6 will not extrude from the wiring 7, and stable electrical connections with each other can be made.
申请公布号 JP2002093848(A) 申请公布日期 2002.03.29
申请号 JP20000277790 申请日期 2000.09.13
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YAMAUCHI KOICHI;YUI TAKASHI
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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