| 摘要 |
PROBLEM TO BE SOLVED: To drastically reduce man-hours for inspecting a semiconductor memory having a (m×n)-bit wide data bus. SOLUTION: It is judged in (m×n)-bit units whether or not all the addresses of a semiconductor memory are normal (step ST13); when all the addresses are judged as normal, the inspection is ended (step ST20); when an abnormal address is present, m-bit data among the (m×n) bits to the abnormal address is compared with its expected value, and when a comparison result is abnormal, the semiconductor memory is judged as unrelievable (step ST25, ST27).
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