发明名称 DRY ETCHING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an upper electrode, and a dry etching system using it, having no possibility of being contaminated with impurities in which not only highly accurate parallelism is kept with respect to a lower electrode but also the etching characteristics are enhanced, and the yield of silicon wafer is increased through good thermal conduction between an electrode plate and a base. SOLUTION: In the upper electrode for a dry etching system comprising a silicon electrode plate and a base supporting it, (a) the base is composed of graphite, and (b) the silicon electrode plate and the base are bonded through organic adhesive containing a filler having Young's modulus of 6×109 to 68×109 N/m2.
申请公布号 JP2002093777(A) 申请公布日期 2002.03.29
申请号 JP20010189065 申请日期 2001.06.22
申请人 NISSHINBO IND INC 发明人 YAMAGUCHI AKIRA;NAKAYAMA FUMITSUGU
分类号 H01L21/302;H01J37/32;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/302
代理机构 代理人
主权项
地址