发明名称 PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE
摘要 <p>A probing device based on mass spectrometry, wherein a fast screening is conducted by using a step (201) of acquiring mass spectrum and a step (202) of judging whether or not an intrinsic m/z ion exists. Switching is made, for scrutinizing, to a step (203) of conducting a tandem mass spectrometry depending on the judged result in the judging step (202). A warning is triggered (205) from the result obtained in the tandem mass spectrometry via a step (204) of judging whether or not an intrinsic m/z ion exists and according to the judgment result. Whereby, a fast and substantially error-free probing is made possible.</p>
申请公布号 WO0225265(A1) 申请公布日期 2002.03.28
申请号 WO2000JP06411 申请日期 2000.09.20
申请人 HITACHI, LTD.;TAKADA, YASUAKI;SAKAIRI, MINORU 发明人 TAKADA, YASUAKI;SAKAIRI, MINORU
分类号 B01D59/44;H01J49/42;(IPC1-7):G01N27/62 主分类号 B01D59/44
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