发明名称 |
PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE |
摘要 |
<p>A probing device based on mass spectrometry, wherein a fast screening is conducted by using a step (201) of acquiring mass spectrum and a step (202) of judging whether or not an intrinsic m/z ion exists. Switching is made, for scrutinizing, to a step (203) of conducting a tandem mass spectrometry depending on the judged result in the judging step (202). A warning is triggered (205) from the result obtained in the tandem mass spectrometry via a step (204) of judging whether or not an intrinsic m/z ion exists and according to the judgment result. Whereby, a fast and substantially error-free probing is made possible.</p> |
申请公布号 |
WO0225265(A1) |
申请公布日期 |
2002.03.28 |
申请号 |
WO2000JP06411 |
申请日期 |
2000.09.20 |
申请人 |
HITACHI, LTD.;TAKADA, YASUAKI;SAKAIRI, MINORU |
发明人 |
TAKADA, YASUAKI;SAKAIRI, MINORU |
分类号 |
B01D59/44;H01J49/42;(IPC1-7):G01N27/62 |
主分类号 |
B01D59/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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