发明名称 |
Testing arrangement for optical devices |
摘要 |
A measuring setup (100, 10, 140) for measuring an optical device under test - DUT- (120) comprises an optical signal source (100) for applying an optical signal to the DUT (120), and an optical receiver unit (140) for measuring a response of the DUT (120) on the applied signal. A measurement unit (10) is coupled between the optical signal source (100) and the optical receiver unit (140). The measurement unit (10) comprises an optical circuit (20) to provide optical signals from and/or to the DUT (120) for measuring the DUT (120), whereby the optical circuit (20) comprises optical components (130) showing high susceptibility to mechanical noise. A shielding unit (30, 40) receives the optical circuit (20) and provides at least partial shielding of the optical circuit (20) and/or the DUT (120) against mechanical noise. <IMAGE> |
申请公布号 |
EP1191322(A1) |
申请公布日期 |
2002.03.27 |
申请号 |
EP20010117060 |
申请日期 |
2001.07.13 |
申请人 |
AGILENT TECHNOLOGIES, INC. (A DELAWARE CORPORATION) |
发明人 |
MAILAENDER, SIEGFRIED;SCHLUETER, MALTE |
分类号 |
G01M11/04;G01M11/00 |
主分类号 |
G01M11/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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