SYSTEM FOR TESTING HIGH VOLTAGE DEVICE

摘要

PURPOSE: A system for testing a high voltage device is disclosed to provide waveform analyzing data about a testing value while guaranteeing DC and AC test values supplied by a verifying device. CONSTITUTION: An IGBT module(50) has a plurality of IGBTs mounted thereon. A matrix section(30) connects a test pine of the IGBT module(50) to an input terminal of a waveform output section(40). The waveform output section(40) is connected to a gate, a drain, and a source of the matrix section(30). The waveform output section(40) measures voltages and currents generated in the gate, the drain, and the source of the matrix section(30) and displays them as waveforms. A controller(10) compares output waveform information of each IGBT measured by the waveform output section(40) and judges whether a test device is good according the comparison result. The controller(10) controls operations of the matrix section(30) and the waveform output section(40).