发明名称 Floating gate memory and manufacturing method
摘要 <p>A self aligned method forms a semiconductor memory array of floating gate memory cells in a semiconductor substrate which has a plurality of spaced apart isolation regions and active regions on the substrate substantially parallel to one another in the column direction. Floating gates (14) are formed in each of the active regions by forming a conductive layer of material. Trenches are formed in the row direction across the active regions, and are filled with a conductive material to form blocks (46) of conductive material for the control gates. Sidewall spacers (44) of conductive material are formed along the floating gate blocks (46) to give the floating gates protruding portions that extend over the floating gate (14). &lt;IMAGE&gt;</p>
申请公布号 EP1191585(A2) 申请公布日期 2002.03.27
申请号 EP20010307977 申请日期 2001.09.19
申请人 SILICON STORAGE TECHNOLOGY, INC. 发明人 WANG, CHIH HSIN
分类号 G11C11/34;H01L21/28;H01L21/336;H01L21/8238;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 G11C11/34
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