发明名称 SURFACE DEFECT INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To allow an inspector to instantaneously judge the degree of a detected flaw. SOLUTION: This surface defect inspection device is provided with an image processing part 201 for inspecting the surface of a continuously conveyed band body to be inspected, to detect a flaw; a determining part 206 for determining at least one of the classification and degree of the flaw to output flaw information; and an image signal output part 207 for outputting an image signal changed in the display color of a symbol according to the flaw information determined by the determining part 206, to a monitor 120 for displaying an image in response to the image signal.
申请公布号 JP2002090309(A) 申请公布日期 2002.03.27
申请号 JP20000284241 申请日期 2000.09.19
申请人 NKK CORP 发明人 KUSHIDA YASUO;SUYAMA TSUNEO;KAZAMA AKIRA
分类号 G01N21/892;G06T1/00 主分类号 G01N21/892
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