发明名称 |
POSITIVE TYPE RESIST COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a positive type resist composition which ensures improved edge roughness of a pattern, solves the problem of development defects and gives excellent resist pattern profile. SOLUTION: The positive type resist composition contains (A) a resin having an alicyclic hydrocarbon group and having a velocity of dissolution in an alkali developing solution increased by the action of an acid, (B) a compound which generates an acid when irradiated with active light or radiation and (C) a nitrogen-containing compound having at least one specified nitrogen-containing partial structure in one molecule. |
申请公布号 |
JP2002090987(A) |
申请公布日期 |
2002.03.27 |
申请号 |
JP20010209543 |
申请日期 |
2001.07.10 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
FUJIMORI TORU;KAWABE YASUMASA;NAKAO HAJIME |
分类号 |
G03F7/004;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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