Integrated circuit device and semiconductor wafer having test circuit therein,申请号US09/379078-传众专利搜索

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发明名称	Integrated circuit device and semiconductor wafer having test circuit therein
摘要
申请公布号	US6362641(B1)	申请公布日期	2002.03.26
申请号	US09/379078	申请日期	1999.08.23
申请人		发明人
分类号		主分类号
代理机构		代理人
主权项
地址

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