发明名称 DRAM cell circuit
摘要 A memory cell contains a memory transistor and a transfer transistor. A gate electrode of the transfer transistor and a control gate electrode of the memory transistor are connected to a word line. The memory transistor has a floating gate electrode that is isolated from a channel region of the memory transistor by a first dielectric layer and is connected to a first source/drain region of the transfer transistor. The control gate electrode is isolated from the floating gate electrode by a second dielectric layer. A first source/drain region of the memory transistor is connected to a bit line. The memory and transfer transistors are preferably of different conductivity types. During the writing of information, the transfer transistor is in the on-state and the memory transistor is in the off-state. During the reading-out of information, the transfer transistor is in the off-state and the memory transistor is in the on-state.
申请公布号 US6362502(B1) 申请公布日期 2002.03.26
申请号 US20000692118 申请日期 2000.10.19
申请人 INFINEON TECHNOLOGIES AG 发明人 ROESNER WOLFGANG;SCHULZ THOMAS;RISCH LOTHAR;HOFMANN FRANZ
分类号 H01L21/8242;H01L27/108;H01L27/12;(IPC1-7):H01L27/108 主分类号 H01L21/8242
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