发明名称 Apparatus and methods for conditioning polishing pads in mechanical and/or chemical-mechanical planarization of microelectronic device substrate assemblies
摘要 Conditioning systems and methods for conditioning polishing pads used in mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies. In one aspect of the invention, a conditioning system includes a conditioning element or conditioning member having a conditioning face configured to engage a polishing pad. The conditioning face preferably includes a bonding medium covering at least a portion of the conditioning face and a plurality of conditioning particles attached to the bonding medium. The conditioning system also includes a corrosion-inhibiting unit that can be coupled to the conditioning element or a liquid on the polishing pad. The corrosion-inhibiting unit retards corrosion of the bonding medium in the presence of chemicals on the polishing pad that would otherwise corrode the bonding medium. For example, the corrosion-inhibiting unit can be a DC power source coupled to the conditioning element and the polishing pad to impart an electrical potential between the conditioning element and the polishing pad that retards corrosion of the bonding medium and/or other components of the conditioning element.
申请公布号 US6361413(B1) 申请公布日期 2002.03.26
申请号 US20000568405 申请日期 2000.05.10
申请人 MICRON TECHNOLOGY, INC. 发明人 SKROVAN JOHN
分类号 B24B37/04;B24B53/00;B24B53/007;(IPC1-7):B24B53/00 主分类号 B24B37/04
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