发明名称 Method for controlling an implant profile in the channel of a transistor
摘要 A method of fabricating an integrated circuit (10, 51, 61, 71, 81, 91) includes forming on the upper surface (13) of a substrate (12) a part (18) which has thereon a side surface (19). A plurality of sidewalls (22, 27 and 83-84) are then formed in succession, outwardly from the side surface. A plurality of successive implants (21, 26, 31, 73-74, 87-88, 93-94) are introduced into the substrate, where a respective different subset of the sidewalls is present when each implant is created. The formation of sidewalls and implants may be carried out in an alternating manner, followed by removal of the sidewalls. Alternatively, removal of the sidewalls and formation of the implants may be carried out in an alternating manner. The width of each sidewall may be sublithographic, and the cumulative width of all sidewalls may be sublithographic.
申请公布号 US6362058(B1) 申请公布日期 2002.03.26
申请号 US20000697922 申请日期 2000.10.26
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 HOUSTON THEODORE W.
分类号 H01L21/266;H01L21/336;H01L29/10;(IPC1-7):H01L21/336 主分类号 H01L21/266
代理机构 代理人
主权项
地址