发明名称 |
Method and apparatus for transforming system simulation tests to test patterns for IC testers |
摘要 |
Techniques are disclosed for functionally testing integrated circuit chips for the particular design for which they are intended. The techniques operate to automatically and intelligently transform a test designed for verifying the design of a simulation model of an electronic system to test patterns for an isolated test on an Automatic Testing Equipment (ATE) system, of a particular integrated circuit chip within the simulation model.
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申请公布号 |
US6363509(B1) |
申请公布日期 |
2002.03.26 |
申请号 |
US19960590695 |
申请日期 |
1996.01.16 |
申请人 |
APPLE COMPUTER, INC. |
发明人 |
PARULKAR ISHWAR;RUPAREL KAMALESH N. |
分类号 |
G01R31/3183;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3183 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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