发明名称 CONTACT STRUCTURE, MANUFACTURING METHOD THEREOF, AND PROBE CONTACT ASSEMBLY USING THE SAME
摘要 PURPOSE: A contact structure, manufacturing method thereof, and probe contact assembly using the same are provided to improve not only the reliability, but also realize a contact construct for a plurality of pins. CONSTITUTION: The contact structure comprises a contact substrate(20) and a plurality of contactors(300). Each contactor(300) further comprises a front end part projecting in its axial direction to form a contact point, a base part inserted into a through-hole bored in the substrate(20), so that the terminal end of the contactor projects as a contact pad(320) for electrical connection from the back surface of the substrate, and a spring part provided between the front end part and the base part to generate contact spring force, when the contactor(300) is pressed against a contact target.
申请公布号 KR20020022130(A) 申请公布日期 2002.03.25
申请号 KR20010056959 申请日期 2001.09.15
申请人 ADVANTEST CORPORATION 发明人 ALDAZ ROBERT EDWARD;KHOURY THEODORE A.;YU DAVID;ZHOU YU
分类号 G01R31/26;G01R1/067;G01R1/073;G01R3/00;G01R31/28;H01L21/00;H01L21/302;H01L21/66;H01L23/485;H01R11/18;H01R12/00;H01R13/24;H05K3/20;H05K3/40 主分类号 G01R31/26
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