发明名称 |
X-RAY FOREIGN MATTER INSPECTION DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide an X-ray foreign matter inspection device allowing the whole of a carrying conveyor 2 to be easily put into or out of a device body 1 while reinforcing an opening part in the device body 1 for passing the carrying conveyor 2 therethrough by giving it a both-side support structure in spite of using the carrying conveyor 2 longer than the fore-and-aft length of the device body 1. SOLUTION: This inspection device is used to inspect foreign matter in an article M with X rays while the article M is being carried on the carrying conveyor 2 and the carrying conveyor 2 can be attached to or detached from the device body 1. The length of the carrying conveyor 2 is set longer than the length in the carrying direction F of the device body 1. One end part 21b of a frame 21 of the carrying conveyor 2 is provided in a bendable manner, relative to the other part 21a of the frame, around a bending fulcrum shaft 25 extending in the lateral directions making right angles with the carrying direction.</p> |
申请公布号 |
JP2002082071(A) |
申请公布日期 |
2002.03.22 |
申请号 |
JP20000272922 |
申请日期 |
2000.09.08 |
申请人 |
ISHIDA CO LTD |
发明人 |
UNO MASAYUKI;IKUTA TAKESHI;TAKAHASHI ATSUSHI |
分类号 |
G01N23/04;B07C5/346;B65G21/10;B65G23/44;(IPC1-7):G01N23/04 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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