发明名称 IMPROVED OXIDE ETCHING
摘要 PROBLEM TO BE SOLVED: To solve the problem that HF conventionally harmful for human being and troublesome in environment is to be used for preparing an integrated circuit and photonics, and to provide improved oxide etching. SOLUTION: In an etching method for silicon dioxide, this method is provided with a process for doping the layer of silicon dioxide and etching the doped layer of silicon dioxide with a phosphoric acid, for forming the doped layer of silicon dioxide.
申请公布号 JP2002083797(A) 申请公布日期 2002.03.22
申请号 JP20010205755 申请日期 2001.07.06
申请人 AGERE SYSTEMS GUARDIAN CORP 发明人 ROBERT WILLIAM CHRISCUOLO;PEARCE CHARLES WALTER
分类号 H01L21/316;H01L21/306;H01L21/3063;H01L21/311;H01L21/76;H01L21/762;(IPC1-7):H01L21/306 主分类号 H01L21/316
代理机构 代理人
主权项
地址