发明名称 |
CLEANING METHOD AND CLEANING DEVICE FOR PHOTOMASK |
摘要 |
PROBLEM TO BE SOLVED: To provide a cleaning method and cleaning device for photomask which effectively remove the foreign matter existing on a photomask. SOLUTION: This cleaning method for photomask consists of irradiating a photomask with UV light for a specified time by using a UV irradiation device of 170 to 180 nm in wavelength of >=90% of the total generated UV light, then cleaning this photomask by using an alkaline cleaning liquid. |
申请公布号 |
JP2002082426(A) |
申请公布日期 |
2002.03.22 |
申请号 |
JP20000270240 |
申请日期 |
2000.09.06 |
申请人 |
TORAY IND INC |
发明人 |
KAKINUKI TAKEHIRO;YAMADA TOMONORI;GOTO TETSUYA;SUZUKI TETSUO |
分类号 |
G02F1/1335;B08B3/08;B08B7/04;G03F1/82 |
主分类号 |
G02F1/1335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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