发明名称 CLEANING METHOD AND CLEANING DEVICE FOR PHOTOMASK
摘要 PROBLEM TO BE SOLVED: To provide a cleaning method and cleaning device for photomask which effectively remove the foreign matter existing on a photomask. SOLUTION: This cleaning method for photomask consists of irradiating a photomask with UV light for a specified time by using a UV irradiation device of 170 to 180 nm in wavelength of >=90% of the total generated UV light, then cleaning this photomask by using an alkaline cleaning liquid.
申请公布号 JP2002082426(A) 申请公布日期 2002.03.22
申请号 JP20000270240 申请日期 2000.09.06
申请人 TORAY IND INC 发明人 KAKINUKI TAKEHIRO;YAMADA TOMONORI;GOTO TETSUYA;SUZUKI TETSUO
分类号 G02F1/1335;B08B3/08;B08B7/04;G03F1/82 主分类号 G02F1/1335
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