发明名称 INTERNAL DEFECT INSPECTING METHOD AND DEVICE OF GLASS PANEL FOR CATHODE-RAY TUBE
摘要 PROBLEM TO BE SOLVED: To provide an internal defect inspecting method and device of a glass panel for a cathode-ray tube capable of facilitating and improving accuracy of detection of internal defects and improving a detection rate of microscopic defects. SOLUTION: Inspection light 3a from a light source 3 is injected into glass from an end face of a seal edge part 1d of the glass panel 1 for the cathode-ray tube supported by a support base 2. Scattered light 3b at an internal defect 6 place of an image screen 1a is detected by contrast with a dark background member 4 arranged from a front face of the image screen 1a to a back face side of the image screen 1a.
申请公布号 JP2002082057(A) 申请公布日期 2002.03.22
申请号 JP20000271919 申请日期 2000.09.07
申请人 NIPPON ELECTRIC GLASS CO LTD 发明人 FUSE TOMOYUKI
分类号 G01N21/84;G01N21/88;H01J9/42;(IPC1-7):G01N21/84 主分类号 G01N21/84
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