发明名称 |
INTERNAL DEFECT INSPECTING METHOD AND DEVICE OF GLASS PANEL FOR CATHODE-RAY TUBE |
摘要 |
PROBLEM TO BE SOLVED: To provide an internal defect inspecting method and device of a glass panel for a cathode-ray tube capable of facilitating and improving accuracy of detection of internal defects and improving a detection rate of microscopic defects. SOLUTION: Inspection light 3a from a light source 3 is injected into glass from an end face of a seal edge part 1d of the glass panel 1 for the cathode-ray tube supported by a support base 2. Scattered light 3b at an internal defect 6 place of an image screen 1a is detected by contrast with a dark background member 4 arranged from a front face of the image screen 1a to a back face side of the image screen 1a.
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申请公布号 |
JP2002082057(A) |
申请公布日期 |
2002.03.22 |
申请号 |
JP20000271919 |
申请日期 |
2000.09.07 |
申请人 |
NIPPON ELECTRIC GLASS CO LTD |
发明人 |
FUSE TOMOYUKI |
分类号 |
G01N21/84;G01N21/88;H01J9/42;(IPC1-7):G01N21/84 |
主分类号 |
G01N21/84 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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