发明名称 Method for the analysis and evaluation of at least three-dimensional specimen data
摘要 The present invention concerns a method for the analysis and evaluation of at least three-dimensional specimen data that are preferably detected with a confocal scanning microscope. By way of an unequivocal input of the necessary process parameters, the intention is to extract and output a portion of the detected specimen data, on the basis of which an analysis and evaluation of the three- or multi-dimensional specimen data is possible. The method according to the present invention is characterized in that at least two points (14, 15) of the specimen data set of the detected specimen data are defined; that at least one plane (17) extending through the defined points (14, 15) is extracted from the specimen data set; and that the plane (17) is output, preferably graphically, on an output unit (13).
申请公布号 US2002035433(A1) 申请公布日期 2002.03.21
申请号 US20010949879 申请日期 2001.09.12
申请人 LEICA MICROSYSTEMS HEIDELBERG GMBH 发明人 BORLINGHAUS ROLF
分类号 G01N33/50;G06F19/00;G06T7/00;G06T15/00;G06T17/40;(IPC1-7):G06F19/00 主分类号 G01N33/50
代理机构 代理人
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