发明名称 |
CMP SYSTEM FOR METAL DEPOSITION |
摘要 |
A system for dished metal redevelopment by providing a metal deposition solution at an interface between a moving semiconductor wafer (1) and a moving polishing pad, which deposits metal onto dished metal (5) in trenches (4) in a layer (3) of an interlayer dielectric; and by polishing the wafer (1) with a relatively reduced polishing pressure to polish metal being deposited. A polishing fluid is disclosed for use in a CMP polishing system, the polishing fluid being a metal deposition solution for dished metal redevelopment. |
申请公布号 |
WO0223613(A2) |
申请公布日期 |
2002.03.21 |
申请号 |
WO2001US28866 |
申请日期 |
2001.09.13 |
申请人 |
RODEL HOLDINGS, INC. |
发明人 |
THOMAS, TERENCE, M.;SO, JOSEPH, K. |
分类号 |
B24B37/04;H01L21/288;H01L21/321;H01L21/768 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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