| 摘要 |
<p>One embodiment of the invention comprises a multiport test set 'MTS' that characterizes a multiterminal DUT (128). The multiport test set comprises a plurality of ports 'N-ports', a signal generator (100) that provides a test signal over a frequency range, a reference receiver (102) coupled (101) to the signal generator that measures the test signal to determine a reference value, and at least one test channel receiver that measures the test signal at each port of the multiport test set. the multiport test set further comprises a switching device (103), coupled between the signal generator, the plurality of ports of the multiport test set and the at least one test channel receiver, that couples the test signal to any port of the multiport test set and to the at least one test channel receiver. The multiport test set further comprises a device for determining S-parameters [S] of the DUT from the test signal measurements at each port of the multiport test set and the reference value, and for converting the S-parameters to a time domain representation.</p> |
