发明名称 Semiconductor device comprising a capacitor and method of manufacturing the same
摘要 <p>There is provided a semiconductor device which comprises a capacitor including a lower electrode, a dielectric film, and an upper electrode, a first protection film formed on the capacitor, a first wiring formed on the first protection film, a first insulating film formed on the first wiring, a second wiring formed on the first insulating film, a second insulating film formed on the second wiring, and at least one of a second protection film formed between the first insulating film and the first wiring to cover at least the capacitor and a third protection film formed on the second insulating film to cover the capacitor and set to an earth potential. Accordingly, the degradation of the ferroelectric capacitor formed under the multi-layered wiring structure can be suppressed. <IMAGE></p>
申请公布号 EP1189262(A2) 申请公布日期 2002.03.20
申请号 EP20010302891 申请日期 2001.03.28
申请人 FUJITSU LIMITED 发明人 HIKOSAKA, YUKINOBU;OZAKI, YASUTAKA;TAKAI, KAZUAKI
分类号 H01L23/52;H01L21/02;H01L21/3205;H01L21/768;H01L21/8242;H01L21/8246;H01L23/522;H01L27/10;H01L27/105;H01L27/108;H01L27/115;(IPC1-7):H01L21/02 主分类号 H01L23/52
代理机构 代理人
主权项
地址