发明名称 SEGMENTED CONTACTOR
摘要 <p>A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.</p>
申请公布号 EP1188061(A1) 申请公布日期 2002.03.20
申请号 EP20000947625 申请日期 2000.06.06
申请人 FORMFACTOR, INC. 发明人 ESLAMY, MOHAMMAD;PEDERSEN, DAVID, V.;COBB, HARRY, D.
分类号 G01R1/073;G01R3/00;G01R31/28;H01L21/66;(IPC1-7):G01R3/00;H01L21/68 主分类号 G01R1/073
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