发明名称 |
Integrated circuits including voltage-controllable power supply systems that can be used for low supply voltage margin testing and related methods |
摘要 |
Integrated circuits and methods use a margin test voltage generator that is powered at a first power supply voltage to generate a second power supply voltage that has a magnitude that is less than the magnitude of the first power supply voltage. During a low supply voltage margin test, a first logic circuit is powered at the first power supply voltage while a second logic circuit, which is the subject of the test, is powered at the second power supply voltage. As a result, the first power supply voltage may remain at a sufficient magnitude to reliably power other devices or components that are not undergoing the low supply voltage margin test.
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申请公布号 |
US6359459(B1) |
申请公布日期 |
2002.03.19 |
申请号 |
US19990399994 |
申请日期 |
1999.09.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOON SEI-SEUNG;HONG SANG-PYO |
分类号 |
G11C11/413;G01R31/40;G11C11/401;G11C11/407;G11C29/50;(IPC1-7):G01R31/28 |
主分类号 |
G11C11/413 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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