发明名称 Leakage testing tool for a bellow of a semiconductor manufacturing machine
摘要 The invention is a leakage testing tool for a bellow of a semiconductor manufacturing machine. The testing tool has a plate, a first rack and an opposite second rack, both racks formed on the plate and supporting the bellow. Two movable plates each engage with a respective one of two adjustment screws. Each adjustment screw can adjust a flat end of one of the movable plates to press on a respective one of two end flanges of the bellow. With the testing tool, whether a bellow is damages can be quickly and conveniently determined, whereby a significant low cost is achieved.
申请公布号 US6357280(B1) 申请公布日期 2002.03.19
申请号 US20000587999 申请日期 2000.06.06
申请人 WINBOND ELECTRONICS CORP. 发明人 HU CHIH-SHENG;LIN ZE-YOU;YEN LEE-FORNG
分类号 G01M3/22;(IPC1-7):G01M3/04;F16K41/10 主分类号 G01M3/22
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