发明名称 |
Leakage testing tool for a bellow of a semiconductor manufacturing machine |
摘要 |
The invention is a leakage testing tool for a bellow of a semiconductor manufacturing machine. The testing tool has a plate, a first rack and an opposite second rack, both racks formed on the plate and supporting the bellow. Two movable plates each engage with a respective one of two adjustment screws. Each adjustment screw can adjust a flat end of one of the movable plates to press on a respective one of two end flanges of the bellow. With the testing tool, whether a bellow is damages can be quickly and conveniently determined, whereby a significant low cost is achieved.
|
申请公布号 |
US6357280(B1) |
申请公布日期 |
2002.03.19 |
申请号 |
US20000587999 |
申请日期 |
2000.06.06 |
申请人 |
WINBOND ELECTRONICS CORP. |
发明人 |
HU CHIH-SHENG;LIN ZE-YOU;YEN LEE-FORNG |
分类号 |
G01M3/22;(IPC1-7):G01M3/04;F16K41/10 |
主分类号 |
G01M3/22 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|