| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor memory which can perform efficiently the write-in of respective redundant cell address data and can reduce the product cost by shortening the process as a whole. SOLUTION: A DUT number in measurement is stored in a DUT number storing section 25, a device selecting signal Dsel form a semiconductor memory device testing device is received through a Dsel terminal 24, in the device selecting signal Dsel, the coincidence/non-coincidence with a stored DUT number is judged by the DUT number storing section 25, redundant cell address data are stored in a redundant cell address data storing section 4 while executing simultaneous measurement by sending the result to an active/non-active selecting circuit 26.</p> |
