DC TEST DEVICE AND SEMICONDUCTOR MEMORY

摘要

PROBLEM TO BE SOLVED: To measure respectively output voltage values from a device to be measured for a test pattern for every AD start. SOLUTION: This device is provided with a sequencer 11 outputting successively a start signal, a timing signal, a write-in signal, and a clock signal when an AD start signal is inputted, an ADC 12 measuring an output of a device 3 to be measured to which a test pattern is inputted a start signal is inputted, an operation logic device outputting an output voltage value of ADC, while outputting a result in which the output voltage value is compared with an expected value to a pattern generator as a pass/fail signal, when a timing signal is inputted, an address counter 14 updating an outputted address value when a clock signal is inputted, and a history memory 15 storing a measured value in an address value when a write-in signal is inputted.