| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that is provided with an input buffer where malfunction due to fluctuations in a threshold voltage of an inverter caused by process variation or the like hardly takes place. SOLUTION: The input buffer uses differential amplifier circuits 32 and 34 respectively having an N-channel differential amplifier stage and a P-channel differential amplifier stage that compare a reference signal VREF with an input signal IN to drive an output circuit 44. An output of the differential amplifier circuit 32 is given to P-channel MOS transistors(TRs) in the output circuit 44 as their gate potential and an output of the differential amplifier circuit 34 is given to N-channel MOS TRs in the output circuit 44 as their gate potential. Thus, the input buffer with fewer malfunctions can be realized.
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